KARAKTERISASI FILM TIPIS BaZr0,35Ti0,65O3 DENGAN SUHU ANNEALING 600 DAN 650 MENGGUNAKAN X-RAY DIFFRACTION
| dc.contributor.author | Dewi, Rahmi | |
| dc.contributor.supervisor | Sela, Fina | |
| dc.date.accessioned | 2021-12-27T04:22:49Z | |
| dc.date.available | 2021-12-27T04:22:49Z | |
| dc.date.issued | 2021-06 | |
| dc.description.abstract | Barium titanate (BaTiO3) is a basic ferroelectric component material which made in the form of a thin film. Barium Titanate is doped with Zr and made a thin film (BaZr0.35Ti0.65O3). BZT is the main material that is most interesting to be studied because it has a high dielectric constant. This thin film was deposited onto glass substrate that assisted by spin coating with speed of 3000 rpm for 30 seconds. The growth of this thin film was made by variying annealing temperature of 600 and 650 for 1 hour. The BaZr0,35Ti0,65O3 was anlyzed using X-Ray Diffraction (XRD) method and the crystallite size of the sample was determined using Scherrer formula. The crystallite size of the sample is affected by the annealing temperature. Moreover, the X-Ray Diffraction results show that the crystal structure of the sample is tetragonal, that has a lattice parameters of a = b = 4.00 and c = 4.02 angstroms. | en_US |
| dc.description.sponsorship | Fisika, Fakultas Matematika dan Ilmu Pengetahuan Alam, Universitas Riau (UNRI) Jl. Prof. Muchtar Luthfi Pekanbaru, 28293, Indonesia | en_US |
| dc.identifier.other | wahyu sari yeni | |
| dc.identifier.uri | https://repository.unri.ac.id/handle/123456789/10347 | |
| dc.language.iso | en | en_US |
| dc.publisher | perpustakaan UR | en_US |
| dc.subject | Barium Zirconium Titanate | en_US |
| dc.subject | Sol-gel Method | en_US |
| dc.subject | Annealing | en_US |
| dc.title | KARAKTERISASI FILM TIPIS BaZr0,35Ti0,65O3 DENGAN SUHU ANNEALING 600 DAN 650 MENGGUNAKAN X-RAY DIFFRACTION | en_US |
| dc.type | Article | en_US |